Atomic Force Microscope (AFM) Scanning Probe Microscope
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Группа авторов Soy Protein-Based Blends, Composites and Nanocomposites
Купить за 19172.14 RUR
This book discusses soy protein nanoparticle-based polymer blends, composites and nanoconposites aling with their chemistry, processing, preparation, characterization, applications as well as the soy protein-based materials rheology. After discussing the preparation of soy protein nanoparticles,
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Bar? Arturo M. Atomic Force Microscopy in Liquid. Biological Applications
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About 40 % of current atomic force microscopy (AFM) research is performed in liquids, making liquid-based AFM a rapidly growing and important tool for the study of biological materials. This book focuses on the underlying principles and experimental aspects of AFM under liquid, with an
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Bhanu Jena P. Force Microscopy
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A complete examination of the uses of the atomic force microscope in biology and medicine This cutting-edge text, written by a team of leading experts, is the first detailed examination of the latest, most powerful scanning probe microscope, the atomic force microscope (AFM). Using the AFM, in
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Greg Haugstad Atomic Force Microscopy. Understanding Basic Modes and Advanced Applications
Купить за 14564.6 RUR
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration,
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Greg Haugstad Atomic Force Microscopy. Understanding Basic Modes and Advanced Applications
Купить за 14705.26 RUR
This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration,
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Myung-Hwan Whangbo Surface Analysis with STM and AFM
Купить за 17826.81 RUR
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by
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Silicon wafer SEM AFM XRD XPS PFM UPS high-purity monocrystalline silicon wafer Raman scanning electron microscope substrate
Купить за 4468.62 RUR
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Singamaneni Srikanth Scanning Probe Microscopy of Soft Matter. Fundamentals and Practices
Купить за 18561.12 RUR
Well-structured and adopting a pedagogical approach, this self-contained monograph covers the fundamentals of scanning probe microscopy, showing how to use the techniques for investigating physical and chemical properties on the nanoscale and how they can be used for a wide range of soft materials.
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Dror Sarid Exploring Scanning Probe Microscopy with MATHEMATICA
Купить за 25585.63 RUR
This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with
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XSP-2C Laboratory Binocular Biological Compound Microscope Scanning Electron Microscope
Купить за 206829.71 RUR
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Tesihan Microscope 2 inch portable LCD digital microscope monocular Microscopio scanning eletron kids microscope
Купить за 18977.63 RUR
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